The Hitachi High-Tech X-Strata920 is a high-tech solution to a wide variety of coating thickness and materials analysis challenges. By combining a large-area proportional detector and a micro-focus X-ray tube, the X-Strata920 provides the best accuracy in its class.
Hitachi’s X-Strata920 fitted with a high-resolution silicon drift detector (SDD) is a high performance, compact, rugged and reliable quality control analyser for simple, rapid coating thickness and composition analysis. Measurements can be made according to international test methods ISO 3497 and ASTM B568.
The X-Strata920 uses the non-destructive analytical technique of energy dispersive X-ray fluorescence (EDXRF) to generate an X-ray spectrum of the sample. This elemental X-ray spectrum is processed using the supplied Fundamental Parameters (FP) or empirical software to produce coating thickness or composition values. The X-Strata920 comes in a range of chamber and base configurations to accommodate samples of different shapes and sizes.
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